On December 11th, PhD student Ruslan Röhrich successfully defended his thesis ‘Unconventional metrology: merging nanophotonics with computational imaging’ at the University of Amsterdam. Röhrich worked on a joint research project with NWO institute AMOLF and industrial partner ASML. His promotors were Stefan Witte (EUV Generation and Imaging) and Femius Koenderink at AMOLF.
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