Research groups
Explore our research groups
ARCNL has 11 research groups within three departments conducting fundamental research in the physics and chemistry of nanolithography. Our research is inspired by ongoing challenges in the semiconductor industry.
Our research groups
Computational Imaging
Arie den Boef
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Contact Dynamics
Bart Weber
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EUV Plasma Processes
Oscar Versolato
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High-Harmonic Generation and EUV Science
Peter Kraus
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Ion Interactions
Ronnie Hoekstra
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Light-Matter Interaction
Paul Planken
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Materials and Surface Science for EUV Lithography
Roland Bliem
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Materials Theory and Modeling
Emilia Olsson
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Nanoscale Imaging and Metrology
Lyuba Amitonova
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Plasma Theory and Modeling
John Sheil
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Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
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